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Author: Aehr Test Systems

Aehr Wins Major New Silicon Photonics Customer with High-Power FOX-XP Wafer-Level Burn-In System for Hyperscale Data Center Optical Interconnect Market

March 31, 2026
Aehr Test Systems to Announce Third Quarter Fiscal 2026 Financial Results on April 7, 2026

March 30, 2026
Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

March 3, 2026
Aehr Receives $14 Million Order from Lead AI Processor Customer for Multiple New Fully Automated FOX-XP Wafer Level Burn-In Systems

February 26, 2026
Aehr Test Systems to Participate in the Susquehanna 15th Annual Technology Conference on February 26, 2026

February 19, 2026
Aehr Secures Key AI Production Burn-in Win with Initial Order of Sonoma Systems for Lead Hyperscale Customer’s Next-Generation AI ASIC Processors

February 12, 2026
Aehr Test Systems to Participate in the 11th Annual Oppenheimer Emerging Growth Conference on February 3, 2026

January 27, 2026
Aehr Test Systems Reports Fiscal 2026 Second Quarter Financial Results and Reinstates Guidance Driven by Improved Visibility for AI Processor and Data Center Semiconductor Test and Burn-In Systems

January 14, 2026
Aehr Announces Over $5.5 Million in Sonoma Ultra-High-Power System Orders to Test and Burn-in AI Processors; Introduces New Fully-Automated Sonoma for Next-Generation AI Applications

January 8, 2026
Aehr Test Systems to Present at the 28th Annual Needham Growth Conference on January 13

January 6, 2026